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wokwi / esp32-test-binaries Public

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test(usb_serial_jtag): adapt for 3 test cases in newer ESP-IDF versions #192

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test(usb_serial_jtag): adapt for 3 test cases in newer ESP-IDF versions

test(usb_serial_jtag): adapt for 3 test cases in newer ESP-IDF versions #192

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test-efuse

succeeded Oct 1, 2024 in 2m 2s

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