Added [[maybe_unused]] to allow building unit test and Silabs apps wi…

…thout loggs
project-chip · Apr 16, 2024 · def66f0 · def66f0
1 parent d8245cb
commit def66f0
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Showing 2 changed files with 16 additions and 16 deletions.
diff --git a/examples/platform/silabs/SoftwareFaultReports.cpp b/examples/platform/silabs/SoftwareFaultReports.cpp
@@ -89,18 +89,18 @@ void OnSoftwareFaultEventHandler(const char * faultRecordString)
 extern "C" __attribute__((used)) void debugHardfault(uint32_t * sp)
 {
 #if SILABS_LOG_ENABLED
-    uint32_t cfsr  = SCB->CFSR;
-    uint32_t hfsr  = SCB->HFSR;
-    uint32_t mmfar = SCB->MMFAR;
-    uint32_t bfar  = SCB->BFAR;
-    uint32_t r0    = sp[0];
-    uint32_t r1    = sp[1];
-    uint32_t r2    = sp[2];
-    uint32_t r3    = sp[3];
-    uint32_t r12   = sp[4];
-    uint32_t lr    = sp[5];
-    uint32_t pc    = sp[6];
-    uint32_t psr   = sp[7];
+    [[maybe_unused]] uint32_t cfsr  = SCB->CFSR;
+    [[maybe_unused]] uint32_t hfsr  = SCB->HFSR;
+    [[maybe_unused]] uint32_t mmfar = SCB->MMFAR;
+    [[maybe_unused]] uint32_t bfar  = SCB->BFAR;
+    [[maybe_unused]] uint32_t r0    = sp[0];
+    [[maybe_unused]] uint32_t r1    = sp[1];
+    [[maybe_unused]] uint32_t r2    = sp[2];
+    [[maybe_unused]] uint32_t r3    = sp[3];
+    [[maybe_unused]] uint32_t r12   = sp[4];
+    [[maybe_unused]] uint32_t lr    = sp[5];
+    [[maybe_unused]] uint32_t pc    = sp[6];
+    [[maybe_unused]] uint32_t psr   = sp[7];
 
     ChipLogError(NotSpecified, "HardFault:");
     ChipLogError(NotSpecified, "SCB->CFSR   0x%08lx", cfsr);

diff --git a/src/crypto/tests/TestChipCryptoPAL.cpp b/src/crypto/tests/TestChipCryptoPAL.cpp
@@ -640,7 +640,7 @@ static void TestRawIntegerToDerInvalidCases(nlTestSuite * inSuite, void * inCont
         { .input = bad_buffer_empty, .output = good_out_buffer, .expected_status = CHIP_ERROR_INVALID_ARGUMENT }
     };
 
-    int case_idx = 0;
+    [[maybe_unused]] int case_idx = 0;
     for (const ErrorCase & v : error_cases)
     {
         CHIP_ERROR status = ConvertIntegerRawToDerWithoutTag(v.input, v.output);
@@ -704,7 +704,7 @@ static void TestReadDerLengthValidCases(nlTestSuite * inSuite, void * inContext)
         { .input_buf = max_byte_length_large_buf, .expected_length = SIZE_MAX },
     };
 
-    int case_idx = 0;
+    [[maybe_unused]] int case_idx = 0;
     for (const SuccessCase & v : cases)
     {
         size_t output_length = SIZE_MAX - 1;
@@ -768,7 +768,7 @@ static void TestReadDerLengthInvalidCases(nlTestSuite * inSuite, void * inContex
         { .input_buf = max_byte_length_large_insufficient_bytes_buf, .expected_status = CHIP_ERROR_BUFFER_TOO_SMALL },
     };
 
-    int case_idx = 0;
+    [[maybe_unused]] int case_idx = 0;
     for (const ErrorCase & v : error_cases)
     {
         size_t output_length = SIZE_MAX;
@@ -2135,7 +2135,7 @@ static void TestX509_VerifyAttestationCertificateFormat(nlTestSuite * inSuite, v
     };
     // clang-format on
 
-    int case_idx = 0;
+    [[maybe_unused]] int case_idx = 0;
     for (auto & testCase : sValidationTestCases)
     {
         ByteSpan cert  = testCase.cert;