feat: cache EVM circuit configuration in unit tests

Cargo.toml

@@ -34,4 +34,4 @@ debug-assertions = true
 overflow-checks = true
 rpath = false
 lto = "thin"
-incremental = false
+incremental = true

zkevm-circuits/src/evm_circuit.rs

@@ -285,6 +285,57 @@ pub(crate) fn detect_fixed_table_tags<F: Field>(block: &Block<F>) -> Vec<FixedTa
         .collect()
 }
 
+#[cfg(any(feature = "test", test))]
+pub(crate) mod cached {
+    use super::*;
+    use halo2_proofs::halo2curves::bn256::Fr;
+    use lazy_static::lazy_static;
+
+    /// Cache
+    struct Cache {
+        cs: ConstraintSystem<Fr>,
+        config: (EvmCircuitConfig<Fr>, Challenges),
+    }
+
+    lazy_static! {
+        static ref CACHE: Cache = {
+            let mut meta = ConstraintSystem::<Fr>::default();
+            let config = EvmCircuit::<Fr>::configure(&mut meta);
+            Cache { cs: meta, config }
+        };
+    }
+
+    pub struct EvmCircuitCached(EvmCircuit<Fr>);
+
+    impl Circuit<Fr> for EvmCircuitCached {
+        type Config = (EvmCircuitConfig<Fr>, Challenges);
+        type FloorPlanner = SimpleFloorPlanner;
+
+        fn without_witnesses(&self) -> Self {
+            Self(self.0.without_witnesses())
+        }
+
+        fn configure(meta: &mut ConstraintSystem<Fr>) -> Self::Config {
+            *meta = CACHE.cs.clone();
+            CACHE.config.clone()
+        }
+
+        fn synthesize(
+            &self,
+            config: Self::Config,
+            layouter: impl Layouter<Fr>,
+        ) -> Result<(), Error> {
+            self.0.synthesize(config, layouter)
+        }
+    }
+
+    impl EvmCircuitCached {
+        pub fn get_test_cicuit_from_block(block: Block<Fr>) -> Self {
+            Self(EvmCircuit::<Fr>::get_test_cicuit_from_block(block))
+        }
+    }
+}
+
 // Always exported because of `EXECUTION_STATE_HEIGHT_MAP`
 impl<F: Field> Circuit<F> for EvmCircuit<F> {
     type Config = (EvmCircuitConfig<F>, Challenges);

zkevm-circuits/src/test_util.rs

@@ -1,7 +1,7 @@
 //! Testing utilities
 
 use crate::{
-    evm_circuit::EvmCircuit,
+    evm_circuit::{cached::EvmCircuitCached, EvmCircuit},
     state_circuit::StateCircuit,
     util::SubCircuit,
     witness::{Block, Rw},
@@ -211,7 +211,7 @@ impl<const NACC: usize, const NTX: usize> CircuitTestBuilder<NACC, NTX> {
 
             let (active_gate_rows, active_lookup_rows) = EvmCircuit::<Fr>::get_active_rows(&block);
 
-            let circuit = EvmCircuit::<Fr>::get_test_cicuit_from_block(block.clone());
+            let circuit = EvmCircuitCached::get_test_cicuit_from_block(block.clone());
             let prover = MockProver::<Fr>::run(k, &circuit, vec![]).unwrap();
 
             self.evm_checks.as_ref()(prover, &active_gate_rows, &active_lookup_rows)