Parameterize CTS tests across all available adapters and devices. #2479
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|
LLVM PR intel/llvm#16519 I think it is worth including the small adapter fix in this, it avoids a lot of extra |
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The new `UUR_KNOWN_FAILURE_ON` macro can be used to skip tests on
devices where the test is known to fail. This can be done in the
following situations.
For all devices in an adapter:
```cpp
UUR_KNOWN_FAILURE_ON(uur::LevelZero{});
```
By substring match of the device name within and adapter:
```cpp
UUR_KNOWN_FAILURE_ON(uur::OpenCL{"Intel(R) UHD Graphics 770"});
```
> Note: This invocation is used in a few places in this patch to
> facilitate clean runs when using this decice.
In certain test suits, where there is no access to a device, the
platform name is used instead:
```cpp
UUR_KNOWN_FAILURE_ON(uur::CUDA{"NVIDIA CUDA BACKEND"});
```
When neither device or platform is available in a test suite, the name
is ignored and only the adapter backend is used to determine if the test
is a known failure.
The macro is variadic making it possible to specify known failures for
multiple adapters in a single place and multiple names can also be provided
per adapter:
```cpp
UUR_KNOWN_FAILURE_ON(
uur::OpenCL{
"Intel(R) UHD Graphics 750",
"Intel(R) UHD Graphics 770",
},
uur::HIP{"Radeon RX 7700"},
uur::NativeCPU{});
```
RossBrunton
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Jan 10, 2025
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