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Basic comp tests: Update to Test plan style (#28145)
* Basic comp tests: Update to Test plan style
Also add in the missing bits.
NOTE: Still missing the topology test - it's getting close to the
deadline and I don't want to rush here and make errors.
* Device composition: duplicate device types
* Appease the python overlords
* Change back default
* Revert "Device composition: duplicate device types"
This reverts commit 333d9d5.
* Apply suggestions from code review
problem=f'Found attribute {attribute_string} on {location.as_cluster_string(self.cluster_mapper)} not listed in attribute list', spec_location="AttributeList Attribute")
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success=False
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ifnotsuccess:
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self.fail_current_test(
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"At least one cluster was missing a mandatory global attribute or had differences between claimed attributes supported and actual.")
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deftest_all_attribute_strings_valid(self):
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asserts.skip("TODO: Validate every string in the attribute tree is valid UTF-8 and has no nulls")
), location=location, problem=f'Attribute {attribute_string} on {location.as_cluster_string(self.cluster_mapper)} is invalid UTF-8', spec_location="Data types - Character String")
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success=False
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ifnotsuccess:
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self.fail_current_test("At least one attribute string was not valid UTF-8")
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deftest_all_event_strings_valid(self):
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asserts.skip("TODO: Validate every string in the read events is valid UTF-8 and has no nulls")
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