We read every piece of feedback, and take your input very seriously.
To see all available qualifiers, see our documentation.
Have a question about this project? Sign up for a free GitHub account to open an issue and contact its maintainers and the community.
By clicking “Sign up for GitHub”, you agree to our terms of service and privacy statement. We’ll occasionally send you account related emails.
Already on GitHub? Sign in to your account
when running the test, be able to specify how many values to test
we have lots of loops which start at some value, then iterate until start_value + range where range is pragmatically low to make the test run faster.
But to achieve more coverage, the range of values tested has to be greater.
So every test should accept an uint64_t value_range which tells it how great the range can be at most.
so we can run
./sd-tests --range 50
for example, which would run each test with 50 different values (if the test supports that)
The text was updated successfully, but these errors were encountered:
No branches or pull requests
when running the test, be able to specify how many values to test
we have lots of loops which start at some value, then iterate until start_value + range
where range is pragmatically low to make the test run faster.
But to achieve more coverage, the range of values tested has to be greater.
So every test should accept an uint64_t value_range which tells it how great the range can be at most.
so we can run
for example, which would run each test with 50 different values (if the test supports that)
The text was updated successfully, but these errors were encountered: