Skip to content
New issue

Have a question about this project? Sign up for a free GitHub account to open an issue and contact its maintainers and the community.

Sign up for GitHub

By clicking “Sign up for GitHub”, you agree to our terms of service and privacy statement. We’ll occasionally send you account related emails.

Already on GitHub? Sign in to your account

Jump to bottom

Please check this tip, it might be interesting to update the library. #4

Open
rtek1000 opened this issue Oct 18, 2020 · 0 comments
Open

Please check this tip, it might be interesting to update the library. #4

rtek1000 opened this issue Oct 18, 2020 · 0 comments

Comments

@rtek1000
Copy link

The DS18X20 B7 chip die (found in the DS18B20, DS1820S, and DS1822 products) can experience EEPROM data corruption failures during power on reset.

Since the EEPROM holds internal trim values (in addition to the user data in the TH and TL registers) that control the conversion process of the DS18X20 this may show up as inaccuracy of temperature readings. And can cause temperature measurement errors of up to ±60°C.

Source: [DS18B20, DS18S20, and DS1822] Potential corruption issues!?
Sign up for free to join this conversation on GitHub. Already have an account? Sign in to comment
Assignees
No one assigned
Labels
None yet
Projects
None yet
Milestone
No milestone
Development

No branches or pull requests
1 participant
@rtek1000